Raman System
A Raman spectroscope (Horiba) with three excitation sources fully integrated with AFM system
Scanning Electron Microscope (SEM)
A tabletop SEM (Phenom ProX) with BDS and EDS detectors
N2 Glove Box
A N2-filled glove box (MBraun) integrated with sputtering and thermal deposition systems
Large-area OLED Fabrication System
A custom-designed thermal evaporator (Syskey) for large-area organic electronic devices
Photolithography system
A photolithography system with semi-auto aligner and exposure system (M&R Nano) for thin-film patterning
Laser etching system
Laser-direct-write dry etching with a 1064-nm laser for mask-free thin-film patterning
Thermal Evaporator
A custom-designed system (Syskey) for simultaneous thermal deposition of organic materials and metals
Photo-Response Platform
An electrical probe station (Everbeing Int'L) in multichannel black box for photo response measurements
High-Vacuum Purification System
Graded sublimation for organic materials.
Impedance Measurement
An impedance measurement equipment (XM SOLARTRON analytical) is based on the frequency response analyzers for impedance/CV/RC.
Sputter system
A custom-designed sputter system with DC & RF Guns by Syskey Technology for dielectric material depositions
Time-of-Flight (TOF)
Time of flight (TOF) is an experimental technique used for the charge carrier mobility of organic semiconductors.
IPCE Measurement System
To evaluate the external quantum efficiency of solar cells
Electroluminescence Measurement
To obtain J-V-L characteristics and emission spectra of OLEDs using a PR-655 spectrophotometer
Ellipsometer
A full-wavelength spectroscopic ellipsometry (Raditech)
Atomic Force Microscope (AFM)
To obtain nano-scale surface topologic characterization with EFM and MFM functions
Electroluminescence Measurement
A photodiode system integrated with an integrated sphere is to evaluate the external quantum efficiency and power efficiency of OLEDs
Semiconductor Characterization System
Keithley 4200 Parameter Analyzer has four SMU channels for organic semiconductor devices and each channel provides high resolution from 100fA to 0.1fA
Time-Resolved Photoluminescence
A transient PL system (Horiba) with a Xe lamp as light source to provide a pico-second time resolution
Surface Profile
The DektakXT stylus profilometer (Bruker) is a measurement of the peak-to-valley height of thin films with low noise and a 10-nm Z-axis resolution
Indoor Solar Simulator
An indoor solar simulator from Industrial Technology Research Institute is to obtain energy conversion efficiency of photovoltaic devices under indoor lights
Zeta Potential
ELSZ-2000ZS (OTSUKA. Japan) can provide the colloidal particles' dispersion and aggregation, surface modification, and important surface zeta-potential et. al. by utilizing the dynamic electrophoretic light scattering method.
Kelvin Probe
KP5050 (KPTtech. UK.) uses contact potential difference to perform WORK FUNCTION of metal or organic/inorganic semiconductors in an atmospheric environment. This technology is expandable in the future for Fermi Level, Valence band and more.
Paios
Paios can perform various electrical and optical characterizations on organic, perovskite and quantum-dot LEDs and solar cells, including the DC, AC and transient characteristics of OLED and solar cells, such as Photo-CELIV, Impednace, CV, TPV, TPC , TEL, DIT, CT, IMPS, IMVS and MELS. PAIOS can obtain consistent and accurate measurement data through simple measurement, and can directly fit all data to establish a reliable devices data database.
